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dc.contributor.authorLima, Alexandre
dc.contributor.authorBorodin, Valeria
dc.contributor.authorDauzère-Pérès, Stéphane
dc.contributor.authorVialletelle, Philippe
dc.date.accessioned2019-08-07T13:13:26Z
dc.date.available2019-08-07T13:13:26Z
dc.date.created2019-07-31T08:56:29Z
dc.date.issued2019
dc.identifier.citationComputers in industry (Print). 2019, 110 3-11.nb_NO
dc.identifier.issn0166-3615
dc.identifier.urihttp://hdl.handle.net/11250/2607480
dc.description.abstractSemiconductor wafer fabrication probably includes the most complex and constrained manufacturing processes due to its intricate and time-varying environment. This paper focuses on Time Constraint Tunnels (TCTs), which can have a very high impact on the yield and reliability of final products. More precisely, the original problem faced by managers of controlling the release of multiple lots in a TCT is addressed in the context of a wafer facility operating in a High-Mix Medium-Volume manufacturing environment. To support the management of TCTs in an industrially acceptable context, a chedulingbased sampling method is proposed to estimate the probability that multiple lots released at the entrance of a given TCT leave this TCT on time. In order to investigate the industrial viability and identify the limitations of the probability-estimation approach, numerical experiments are conducted on real-life data and analyzed through the prism of several relevant performance criteria. Insights gathered from this numerical analysis are then used to discuss the specific management requirements that stem from the criticality of TCTs in semiconductor manufacturing facilitiesnb_NO
dc.language.isoengnb_NO
dc.publisherElseviernb_NO
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/deed.no*
dc.titleSampling-based release control of multiple lots in time constraint tunnelsnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionacceptedVersionnb_NO
dc.rights.holderElseviernb_NO
dc.source.pagenumber3-11nb_NO
dc.source.volume110nb_NO
dc.source.journalComputers in industry (Print)nb_NO
dc.identifier.doi10.1016/j.compind.2019.04.014
dc.identifier.cristin1713361
cristin.unitcode158,13,0,0
cristin.unitnameInstitutt for regnskap, revisjon og foretaksøkonomi
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode2


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Attribution-NonCommercial-NoDerivatives 4.0 Internasjonal
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